Crossmark

Multiple Retest Systems for Screening High-Quality Chips

Crossref DOI link: https://doi.org/10.1007/s10836-023-06051-0

Published Online: 2023-02-20

Published Print: 2023-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Yeh, Chung-Huang https://orcid.org/0000-0002-8249-6171
Chen, Jwu E.
License Information

Text and Data Mining valid from 2023-02-20

Version of Record valid from 2023-02-20
More Information

Article History

Received: 13 August 2022

Accepted: 6 February 2023

First Online: 20 February 2023

Declarations

:

: The authors declare that they have no conflict of interest.