Crossmark

Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation

Published Online: 2023-04-25

Published Print: 2023-04

Authors

Song, Tai https://orcid.org/0000-0002-7082-4211
Huang, Zhengfeng

Guo, Xiaohui

Milos, Krstic
Funding

Funding for this research was provided by:

NSFC (62274052)

China Scholarship Council (202206505003)
License Information

Text and Data Mining valid from 2023-04-01

Version of Record valid from 2023-04-01
More Information

Article History

Received: 14 August 2022

Accepted: 28 February 2023

First Online: 25 April 2023

Declarations

:

: The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Document is current