Fault isolation by test scheduling for embedded systems using a probabilistic approach
Crossref DOI link: https://doi.org/10.1007/s10845-015-1088-7
Published Online: 2015-05-08
Published Print: 2018-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Aït-Kadi, Daoud
Simeu-Abazi, Zineb
Arous, Ahmed
Text and Data Mining valid from 2015-05-08