Conductive particle detection via deep learning for ACF bonding in TFT-LCD manufacturing
Crossref DOI link: https://doi.org/10.1007/s10845-019-01494-9
Published Online: 2019-09-30
Published Print: 2020-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liu, Eryun https://orcid.org/0000-0002-2344-4283
Chen, Kangping
Xiang, Zhiyu
Zhang, Jun
Funding for this research was provided by:
National Natural Science Foundation of China (U1709214)
Text and Data Mining valid from 2019-09-30
Version of Record valid from 2019-09-30
Article History
Received: 29 April 2019
Accepted: 21 September 2019
First Online: 30 September 2019