Document is current

Any future updates will be listed below

Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel

Crossref DOI link: https://doi.org/10.1007/s10845-019-01502-y

Published Online: 2019-10-30

Published Print: 2020-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark