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Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study

Crossref DOI link: https://doi.org/10.1007/s10845-020-01680-0

Published Online: 2020-10-13

Published Print: 2022-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Fu, Wenhan

Chien, Chen-Fu https://orcid.org/0000-0003-3328-4946
Tang, Lizhen
Funding

Funding for this research was provided by:

Ministry of Science and Technology, Taiwan (MOST 108-2634-F-007-001)

Ministry of Science and Technology, Taiwan (MOST 108-2634-F-007-008)
License Information

Text and Data Mining valid from 2020-10-13

Version of Record valid from 2020-10-13
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Article History

Accepted: 24 September 2020

First Online: 13 October 2020

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