Crossmark

Multi-source wafer map retrieval based on contrastive learning for root cause analysis in semiconductor manufacturing

Published Online: 2023-11-06

Published Print: 2025-01

Authors

Hong, Wei-Jyun

Shen, Chia-Yu

Wu, Pei-Yuan https://orcid.org/0000-0001-7860-3678
Funding

Funding for this research was provided by:

Taiwan Semiconductor Manufacturing Company (110HZA3K00G)
License Information

Text and Data Mining valid from 2023-11-06

Version of Record valid from 2023-11-06
More Information

Article History

Received: 31 October 2022

Accepted: 5 October 2023

First Online: 6 November 2023

Declarations

:

: The authors declare that they have no other conflict of interest besides funding agency.

Document is current