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Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry

Crossref DOI link: https://doi.org/10.1007/s10845-023-02310-1

Published Online: 2023-12-30

Published Print: 2025-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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