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Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning

Published Online: 2024-07-01

Published Print: 2025-08

Authors

Sheng, Yi

Yan, Jinda

Piao, Minghao https://orcid.org/0000-0001-7348-0752
Funding

Funding for this research was provided by:

Priority Academic Program Development of Jiangsu Higher Education Institutions
License Information

Text and Data Mining valid from 2024-07-01

Version of Record valid from 2024-07-01
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Article History

Received: 1 January 2024

Accepted: 17 June 2024

First Online: 1 July 2024

Declarations

:

: The authors provide no conflict of interest associated with the content of this article.

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