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Two-phase cost-sensitive-learning-based framework on customer-side quality inspection for TFT-LCD industry

Published Online: 2024-07-07

Published Print: 2025-08

Authors

Shih, Ming-Sung

Chen, James C.

Chen, Tzu-Li https://orcid.org/0000-0003-2025-8853
Hsu, Ching-Lan
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Text and Data Mining valid from 2024-07-07

Version of Record valid from 2024-07-07
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Article History

Received: 9 December 2023

Accepted: 20 June 2024

First Online: 7 July 2024

Declarations

:

: The authors declare that they have no conflict of interest.

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