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SDCViT: a transformer-powered hierarchical framework for semiconductor defect detection and classification

Published Online: 2026-02-06

Authors

Jain, Shaurya

Charan Kumari, A.

Srinivas, K. https://orcid.org/0009-0002-3884-6282
License Information

Text and Data Mining valid from 2026-02-06

Version of Record valid from 2026-02-06
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Article History

Received: 17 February 2025

Accepted: 13 January 2026

First Online: 6 February 2026

Declarations

:

: The authors have no relevant financial or non-financial interests to disclose.

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