Reassessment of degradation mechanisms in anodic tantalum oxide capacitors under high electric fields
Crossref DOI link: https://doi.org/10.1007/s10853-014-8656-7
Published Online: 2014-10-29
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Su, Xin
Viste, Mark
Hossick-Schott, Joachim
Yang, Lei
Sheldon, Brian W.
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