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Quantitative correlation of interfacial contamination and antiphase domain boundary density in GaAs on Si(100)

Crossref DOI link: https://doi.org/10.1007/s10853-015-9334-0

Published Online: 2015-08-13

Published Print: 2016-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Barrett, C. S. C.

Lind, A. G.

Bao, X.

Ye, Z.

Ban, K. Y.

Martin, P.

Sanchez, E.

Xin, Y.

Jones, K. S.
Funding

Funding for this research was provided by:

Applied Materials
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Text and Data Mining valid from 2015-08-13