Structural and plasmonic characteristics of sputtered SnO2:Sb and ZnO:Al thin films as a function of their thickness
Crossref DOI link: https://doi.org/10.1007/s10853-016-0010-9
Published Online: 2016-05-04
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Guillén, C.
Herrero, J.
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