Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots
Crossref DOI link: https://doi.org/10.1007/s10853-016-0051-0
Published Online: 2016-05-17
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fernández-Delgado, N.
Herrera, M.
Chisholm, M. F.
Kamarudin, M. A.
Zhuang, Q. D.
Hayne, M.
Molina, S. I.
Funding for this research was provided by:
MINECO (SPAIN) (TEC2014-53727-C2-2-R, CONSOLIDER INGENIO 2010 CSD2009-00013)
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