Crossmark

Microstructure and strength of AlN–SiC interface studied by synchrotron X-rays

Crossref DOI link: https://doi.org/10.1007/s10853-016-0679-9

Published Online: 2017-01-02

Published Print: 2017-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Argunova, T. S.

Gutkin, M. Yu.

Shcherbachev, K. D.

Je, J. H.

Lim, J. -H.

Kazarova, O. P.

Mokhov, E. N.
Funding

Funding for this research was provided by:

Russian Science Foundation (14-29-00086, 16–42–01098)

Korea Institute for Advancement of Technology
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