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Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction

Crossref DOI link: https://doi.org/10.1007/s10853-017-0909-9

Published Online: 2017-02-27

Published Print: 2017-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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