A review of soft errors and the low α-solder bumping process in 3-D packaging technology
Crossref DOI link: https://doi.org/10.1007/s10853-017-1421-y
Published Online: 2017-07-28
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jung, D. H. http://orcid.org/0000-0003-3480-1693
Sharma, A. http://orcid.org/0000-0003-0413-4623
Jung, J. P. http://orcid.org/0000-0002-4526-0442
Funding for this research was provided by:
University of Seoul
License valid from 2017-07-28