Characterization of quaternary Zn/Sn-codoped GaN films obtained with Zn x Sn0.04GaN targets at different Zn contents by the RF reactive magnetron sputtering technology
Crossref DOI link: https://doi.org/10.1007/s10853-018-2202-y
Published Online: 2018-03-08
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kuo, Dong-Hau http://orcid.org/0000-0001-9300-8551
Liu, Yen-Tzu
Text and Data Mining valid from 2018-03-08
Article History
Received: 2 January 2018
Accepted: 3 March 2018
First Online: 8 March 2018