Electrical conductivity determination of semiconductors by utilizing photography, finite element simulation and resistance measurement
Crossref DOI link: https://doi.org/10.1007/s10853-021-05949-4
Published Online: 2021-03-08
Published Print: 2021-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Rui
Moos, Ralf http://orcid.org/0000-0001-7622-0120
Funding for this research was provided by:
Universität Bayreuth
Text and Data Mining valid from 2021-03-08
Version of Record valid from 2021-03-08
Article History
Received: 2 December 2020
Accepted: 18 February 2021
First Online: 8 March 2021