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Monitoring of the recovery of ion-damaged 4H-SiC with in situ synchrotron X-ray diffraction as a tool for strain-engineering

Published Online: 2022-11-12

Published Print: 2022-11

Authors

Chakravorty, Anusmita

Boulle, Alexandre

Debelle, Aurélien

Monnet, Isabelle

Manna, Gouranga

Saha, Pinku

Mukhopadhyay, Mrinmay Kumar

Kabiraj, Debdulal https://orcid.org/0000-0002-1417-9596
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Text and Data Mining valid from 2022-11-01

Version of Record valid from 2022-11-01
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Article History

Received: 13 April 2022

Accepted: 25 October 2022

First Online: 12 November 2022

Declarations

:

: The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

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