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Study of MAX phase based Schottky interfacial structure: the case of electron-beam deposited epitaxial Cr2AlC film on p–Si (100)

Published Online: 2023-02-22

Published Print: 2023-03

Authors

Patel, Prayas Chandra https://orcid.org/0000-0003-3973-4530
Mishra, Pankaj Kumar

Kandpal, Hem C.
Funding

Funding for this research was provided by:

Indian Institute of Technology Roorkee (OH-31-22-609-414)
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Text and Data Mining valid from 2023-02-22

Version of Record valid from 2023-02-22
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Article History

Received: 28 November 2022

Accepted: 5 February 2023

First Online: 22 February 2023

Declarations

:

: On behalf of all authors, the corresponding authors state that there is no conflict of interest.

: Not applicable.

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