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Testing the accuracy of low-beam-energy electron-excited X-ray microanalysis with energy-dispersive spectrometry

Crossref DOI link: https://doi.org/10.1007/s10853-024-10285-4

Published Online: 2024-10-14

Published Print: 2024-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Newbury, Dale E. https://orcid.org/0000-0003-3865-4344
Ritchie, Nicholas W. M. https://orcid.org/0000-0001-5734-5729
Funding

Funding for this research was provided by:

National Institute of Standards and Technology
License Information

Text and Data Mining valid from 2024-10-01

Version of Record valid from 2024-10-14
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Article History

Received: 29 August 2024

Accepted: 25 September 2024

First Online: 14 October 2024