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Microstructural and phase evolution in Nb–Si intermetallic thin films deposited using the pulsed laser ablation technique

Crossref DOI link: https://doi.org/10.1007/s10853-024-10394-0

Published Online: 2024-11-12

Published Print: 2025-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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