Enhanced reliability of Sn–Ag–Bi–In joint under electric current stress by adding Co/Ni elements
Crossref DOI link: https://doi.org/10.1007/s10854-014-1988-x
Published Online: 2014-05-11
Published Print: 2014-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Youngseok
Nagao, Shijo
Sugahara, Tohru
Suganuma, Katsuaki
Ueshima, Minoru
Albrecht, Hans-Juergen
Wilke, Klaus
Strogies, Joerg
Text and Data Mining valid from 2014-05-11