Microstructural defect properties of InGaN/GaN blue light emitting diode structures
Crossref DOI link: https://doi.org/10.1007/s10854-014-2108-7
Published Online: 2014-06-28
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Baş, Y.
Demirel, P.
Akın, N.
Başköse, C.
Özen, Y.
Kınacı, B.
Öztürk, M. K.
Özçelik, S.
Özbay, E.
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