Oxygen vacancy induced dielectric relaxation studies in Bi4−xLaxTi3O12 (x = 0.0, 0.3, 0.7, 1.0) ceramics
Crossref DOI link: https://doi.org/10.1007/s10854-014-2205-7
Published Online: 2014-08-02
Published Print: 2014-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bhardwaj, Sumit
Paul, Joginder
Chand, Subhash
Raina, K. K.
Kumar, Ravi
Text and Data Mining valid from 2014-08-02