Semi-empirical modelling of the di-interstitial defect in silicon
Crossref DOI link: https://doi.org/10.1007/s10854-014-2326-z
Published Online: 2014-09-21
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Londos, C. A.
Angeletos, T.
Chroneos, A.
Text and Data Mining valid from 2014-09-21
