Effects of annealing temperatures on crystalline quality of silicon based (Ba0.3Sr0.7)(Zn1/3Nb2/3)O3 dielectric ceramic thin films by sol–gel process
Crossref DOI link: https://doi.org/10.1007/s10854-014-2386-0
Published Online: 2014-10-18
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cao, Gang
Wu, Shihua
Shi, Feng
Text and Data Mining valid from 2014-10-18
