Influence of post-annealing time on properties of ZnO: (Li, N) thin films prepared by ion beam enhanced deposition method
Crossref DOI link: https://doi.org/10.1007/s10854-014-2466-1
Published Online: 2015-03-06
Published Print: 2015-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xie, Jiansheng
Lu, Qi-fei
Chen, Qiang
Text and Data Mining valid from 2015-03-06