Studies of the effects of addition of P and Cr on microstructure and electrical resistivity of nanocrystalline CoFe thin films
Crossref DOI link: https://doi.org/10.1007/s10854-015-2783-z
Published Online: 2015-02-05
Published Print: 2015-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Taslimi, H.
Heydarzadeh Sohi, M.
Mehrizi, S.
Saremi, M.
Text and Data Mining valid from 2015-02-05