Microstructure evolution and electrical property improvement of Mn-based thin film thermistors with the sandwich structure
Crossref DOI link: https://doi.org/10.1007/s10854-015-3218-6
Published Online: 2015-05-27
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
He, L.
Ling, Z. Y.
Wu, M. Y.
Zhang, G.
Ling, D. X.
Liu, M. X.
Yang, L.
Text and Data Mining valid from 2015-05-27