Analytical bathtub curve with application to electron device reliability
Crossref DOI link: https://doi.org/10.1007/s10854-015-3263-1
Published Online: 2015-06-05
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Suhir, E.
Text and Data Mining valid from 2015-06-05