Crossmark

Influence of different S/Se ratio on the properties of Cu2Sn(S x Se1-x )3 thin films fabricated by annealing stacked metal precursors

Crossref DOI link: https://doi.org/10.1007/s10854-015-3276-9

Published Online: 2015-06-02

Published Print: 2015-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Dong, Yuchen

He, Jun

Tao, Jiahua

Sun, Lin

Yang, Pingxiong

Chu, Junhao
Funding

Funding for this research was provided by:

The National Natural Science Foundation of China (61106064, 61376129, 61474045)

The State Key Basic Research Program of China (2013CB922300)
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