Crossmark

The effect of stacking sequence and thickness on the structure and microwave dielectric properties of heterogenous Ca(Mg1/3Ta2/3)O3/CaTiO3 thin films

Crossref DOI link: https://doi.org/10.1007/s10854-015-3365-9

Published Online: 2015-06-27

Published Print: 2015-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Li, Runrun

Chen, Wen

Zhou, Jing

Sun, Huajun

Bao, Yiwang
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (51072148)

Key Programme of Natural Science Foundation of China (50932004)

Program for New Century Excellent Talents in University (NCET-09-0628)

Key Project of Chinese Ministry of Education (109111)
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