Micromorphology characterization of copper thin films by AFM and fractal analysis
Crossref DOI link: https://doi.org/10.1007/s10854-015-3628-5
Published Online: 2015-08-18
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Arman, Ali http://orcid.org/0000-0003-1246-0453
Ţălu, Ştefan
Luna, Carlos
Ahmadpourian, Azin
Naseri, Mosayeb
Molamohammadi, Mehrdad
Text and Data Mining valid from 2015-08-18