Crossmark

Effects of excess Bi on structure and electrical properties of BiFeO3 thin films deposited on indium tin oxide substrate using sol–gel method

Crossref DOI link: https://doi.org/10.1007/s10854-015-3693-9

Published Online: 2015-09-02

Published Print: 2015-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Xie, Xiaobin

Yang, Shiju

Zhang, Fengqing

Fan, Suhua

Che, Quande

Wang, Cuijuan

Guo, Xiaodong

Zhang, Liping
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (50872075)

National Natural Science Foundation of China (51272142)

A Project of Shandong Province Higher Educational Science and Technology Program (J15LA05)
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