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Influence of accuracy of crystallographic plane by specific crystallographic plane cutting of WEDM and post-processing of crystal surface contour

Crossref DOI link: https://doi.org/10.1007/s10854-015-3722-8

Published Online: 2015-09-04

Published Print: 2016-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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