Annealing induced amorphous/crystalline silicon interface passivation by hydrogen atom diffusion
Crossref DOI link: https://doi.org/10.1007/s10854-015-3806-5
Published Online: 2015-10-07
Published Print: 2016-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dai, Xiaowan
Cai, Hongkun
Zhang, Dexian
Chen, Guifeng
Wang, Yong
Liu, Wei
Sun, Yun
Funding for this research was provided by:
Science and Technology Program of Hebei Province (15214305D)
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