Doping and thickness variation influence on the structural and sensing properties of NiO film prepared by RF-magnetron sputtering
Crossref DOI link: https://doi.org/10.1007/s10854-015-3885-3
Published Online: 2015-10-28
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hassan, Ehssan Salah
Saeed, Asrar Abdulmunem
Elttayef, Abdulhussain K.
License valid from 2015-10-28