Stress evolution in AlN and GaN grown on Si(111): experiments and theoretical modeling
Crossref DOI link: https://doi.org/10.1007/s10854-015-3984-1
Published Online: 2015-11-02
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dai, Yiquan https://orcid.org/0000-0002-7726-6371
Li, Shuiming
Gao, Hongwei
Wang, Weihui
Sun, Qian
Peng, Qing
Gui, Chengqun
Qian, Zhengfang
Liu, Sheng
Funding for this research was provided by:
National Hightech Program (863) (SS2015AA041802)
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