Infrared study of defects in nitrogen-doped electron irradiated silicon
Crossref DOI link: https://doi.org/10.1007/s10854-015-3991-2
Published Online: 2015-11-04
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sgourou, E. N.
Angeletos, T.
Chroneos, A.
Londos, C. A.
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