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Dielectric properties of bismuth niobate films using LaNiO3 bottom electrode

Crossref DOI link: https://doi.org/10.1007/s10854-015-4103-z

Published Online: 2015-11-26

Published Print: 2016-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Goncalves, L. F.

Rocha, L. S. R.

Silva, C. C.

Cortés, J. A.

Ramirez, M. A.

Simões, A. Z.
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