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Effect of 200 MeV Ag12+ ion irradiations on structural, morphological and magnetic properties of HoFe1−xNixO3 (x = 0.0, 0.1, 0.3 and 0.5) thin films grown on Si (100) substrates

Crossref DOI link: https://doi.org/10.1007/s10854-015-4195-5

Published Online: 2015-12-11

Published Print: 2016-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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