The influence of Yttrium on leakage current and dielectric properties of amorphous Al2O3 thin film derived by sol–gel
Crossref DOI link: https://doi.org/10.1007/s10854-016-4767-z
Published Online: 2016-04-21
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yao, Manwen
Zou, Pei
Su, Zhen
Chen, Jianwen
Yao, Xi
Funding for this research was provided by:
Ministry of Science and Technology of the People's Republic of China (CN) (2015CB654601)
Text and Data Mining valid from 2016-04-21