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Investigation of physico-chemical properties of conductive Ga-doped ZnO thin films deposited on glass and silicon wafers by RF magnetron sputtering

Crossref DOI link: https://doi.org/10.1007/s10854-016-5494-1

Published Online: 2016-08-06

Published Print: 2017-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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