The relationship between deep-level defects and high resistivity characteristic in CdZnTe crystals
Crossref DOI link: https://doi.org/10.1007/s10854-016-6223-5
Published Online: 2016-12-21
Published Print: 2017-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Peng-fei
Nan, Rui-hua
Jian, Zeng-yun
Funding for this research was provided by:
National Natural Science Foundation of China (51502234)
License valid from 2016-12-21