Measurements of defect PL in a-Si:H by means of frequency resolved spectroscopy
Crossref DOI link: https://doi.org/10.1007/s10854-017-6528-z
Published Online: 2017-02-14
Published Print: 2017-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ogihara, C.
License valid from 2017-02-14
