MOVPE growth of InAsBi/InAs/GaAs heterostructure analyzed by in situ spectral reflectance
Crossref DOI link: https://doi.org/10.1007/s10854-017-6595-1
Published Online: 2017-02-25
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Boussaha, R.
Fitouri, H.
Rebey, A.
El Jani, B.
License valid from 2017-02-25