The CiOi(SiI)2 defect in silicon: density functional theory calculations
Crossref DOI link: https://doi.org/10.1007/s10854-017-6797-6
Published Online: 2017-04-05
Published Print: 2017-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Christopoulos, S.-R. G.
Sgourou, E. N.
Angeletos, T.
Vovk, R. V.
Chroneos, A.
Londos, C. A.
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